NON-DESTRUCTIVE COUNTERFEIT IC SCREENING

Program Description:

As counterfeit and suspect semiconductor devices continue to pose risks across defense, aerospace, and commercial supply chains, reliable screening methods to identify counterfeits remain essential. This session introduces a practical, non-destructive approach to counterfeit detection using RTI’s MultiTrace™ automated curve tracer hardware and DataTrace™ parametric analysis software. Designed for batch comparison testing, RTI’s solution identifies outlier devices by evaluating electrical signatures against known good devices (KGDs)—without the cost, complexity, or sample destruction required by traditional techniques or high-end ATE systems. Attendees will gain an understanding of the full test workflow, including hardware setup, fixture design considerations, software configuration, and automated reporting. Emphasis will be placed on how automated data collection/extraction and batch analysis can be performed quickly, efficiently, and with minimal operator training. Ideal for electrical test engineers, component distributors, government agencies, and organizations tasked with quality assurance or counterfeit mitigation, this presentation highlights RTI’s configurable tools as a low-risk, low-cost alternative to destructive physical analysis or incomplete optical inspection alone. Whether you're looking to enhance your existing screening process or implement a scalable solution for routine lot verification, this session will demonstrate how RTI’s approach offers a practical, efficient alternative to both high-end ATE systems and resource-intensive lab analysis.